EDX Checker

The EM-Tec EDX-Checker has been developed as a cost-efficient tool for quick and easy checking of calibration, performance, and resolution of an EDX system on an SEM.  Regular use of the EDX-Checker ensures optimum performance of the EDX detector. The EM-Tec EDX-Checker consists of a standard aluminium SEM pin stub with Ni grids and the reference materials C, PTFE, Mn, Co, AISI 316L and Al/Cu embedded in a vacuum compatible epoxy resin. The EDX-Checker is polished down to 0.5um and coated with carbon. The additional boron nitride is not carbon coated.

• Quick and easy EDX calibration and performance check
• Ideal for EDX systems from EDAX, Thermo, Bruker, Oxford Instruments, IXRF, Phenom and JEOL
• Polished surface – no topography artefacts with the reference materials
• Available in two versions
• Known and consistent take-off angle due to polished surface
• Hexagonal white BN does not need conductive carbon coating
• Low magnification image and X-ray mapping calibration
• Compact and cost effective
• Available as a pin stub and with adaptors for JEOL and Hitachi SEMs

EM-Tec EDX-Checker is available in three versions for all brands of SEM:

• EDX-Checker S-7 with C, PTFE, Mn, Co and Al/Cu as reference materials and Ni grids with 400 plus 1000 mesh for quick magnification, calibration and mapping check. Ideally suited for table top SEMs with EDS.
• EDX-Checker S8 with C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping check. Ideally suited for table top SEMs with EDS.
• EDX-Checker LE-10 with BN, C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and a 400 mesh nickel grid for quick magnification calibration and mapping check. Optimised for low element performance checking.

Purpose of reference materials in the EM-Tec EDX-Checker:

Ordering information: