FIB grid holders

EM-Tec FIB grid holders are all  precision machined from vacuum grade aluminium:

• EM-Tec F12 is a basic yet practical FIB grid holder for two FIB grids. Based on a standard Ø12.7mm SEM pin stub, it is compact, low cost and idealfor storing valuable samples. The 10mm wide vice clamp includes a ledge for easy positioning of FIB grids. Available with standard pin and short Zeiss pin (EM-Tec F12Z)
• EM-Tec F12LP is a low profile version of the EM-Tec F12 grid holder for two FIB grids. The low height and small dimensions allow for high tilt operation at low working distances. The 12.5mm wide vice clamp includes a ledge for easy positioning of FIB grids.
• EM-Tec F18 is a high capacity FIB grid holding stub for holding up to eight FIB grids with four individual small clamps. It is basically four times the EM-Tec F12 on a 25.4mm (1”) SEM stub. Each of the 10mm wide vice clamps includes a ledge for easy positioning of the FIB grids. It is ideal for the safe storage of the FIB grids with lamellas or for high throughput FIB applications.
• EM-Tec F25 is a larger FIB grid holder which can accommodate up to five FIB grids of the same thickness. The 25mm wide vice includes a ledge for easy positioning of the FIB grids and two brass thumb screws to operate the vice. Available with pin stub and M4 threaded hole.
• EM-Tec FS21 combines the EM-Tec F12 FIB grid holder with two standard 12.7mm (1/2”) SEM pin stubs. The F12 FIB grid holder and the sample stubs can be rotated in the holder for selecting the optimum orientation in the FIB-SEM system. The EM-Tec FS21 FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using silicon wafer samples. Available with SEM pin stub and M4 threaded hole.
• EM-Tec FS22 combines two F12 FIB grid holders with two standard 12.7mm (1/1”) SEM pin stubs within a 27 x 27mm footprint. Both the F12 FIB grid holders and the pin stubs can be rotated independently in the holder for selecting the optimum orientation in the FIB-SEM system. The EM-Tec FS22 dual FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are conveniently at the same level when using silicon wafer samples. Available with SEM pin stub and M4 threaded hole.
• EM-Tec FS25 combines the wider FIB grid holder vice with a holder for samples on Ø25.4mm SEM pin stubs in a single compact holder. This provides a single loading cycle for FIB grids and samples and short distances from lift-out to lamellae mounting. The wafer-type sample surface is at the same height as the FIB grid posts. Available with SEM pin stub and M4 threaded hole.

Ordering information: